The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Nov. 19, 2018
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Yutaka Oishi, Kawasaki, JP;

Chiaki Oishi, Yokohama, JP;

Shuji Umehara, Kawasaki, JP;

Takuya Goto, Kodaira, JP;

Masaki Saitoh, Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/46 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/6262 (2013.01); G06K 9/4642 (2013.01); G06T 7/0012 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30061 (2013.01); G06T 2207/30096 (2013.01);
Abstract

A method, computer system, and a computer program product for digital image recognition determination using a learned model is provided. The present invention may include acquiring a first determination result by making a determination concerning first data, using a first learned model. The present invention may include selecting a partial region of the first data. The present invention may then include generating second data obtained by applying a first alteration process to the partial region. The present invention may also include acquiring a second determination result by making a determination concerning the second data, using a second learned model. The present invention may lastly include obtaining a final determination result based on the first determination result and the second determination result.


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