The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Oct. 17, 2016
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Ronald Dupey, Onalaska, WI (US);

Ryan Champlin, La Crosse, WI (US);

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/2365 (2019.01);
Abstract

A computer-implemented method for performing a data quality function includes receiving, at a data quality function process, at least one record from a source, where the record includes data, semantic annotations and data quality annotations associated with the data in the record. The semantic annotations are attributes that define the data including input format and output format and the data quality annotations are attributes that define data quality rules to be applied to the data. The data quality function process automatically maps the semantic annotations to data quality input fields and to data quality output fields. The data quality function process applies the data quality rules to the data using the data quality annotations to perform a data quality function. The data quality function process performs the data quality function on the data and outputs the data to a destination in a format defined by the data quality output fields.


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