The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Jul. 18, 2018
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Shiri Gaber, Beer Sheva, IL;
Omer Sagi, Mazkeret Batya, IL;
Amihai Savir, Sansana, IL;
Ohad Arnon, Beit Nir, IL;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Techniques are provided for system operational analytics using additional features over time-series counters for health score computation. An exemplary method comprises: obtaining log data from data sources of a monitored system; applying a counting function to the log data to obtain time-series counters for a plurality of distinct features within the log data; applying an additional function to the time-series counters for the plurality of distinct features; and processing an output of the additional function using a machine learning model to obtain a health score for the monitored system based on the output of the additional function. The additional function comprises, for example, an entropy function representing a load balancing of a plurality of devices in the monitored system; one or more clustered counts for a plurality of entities in the monitored system; a number of unique values; and/or one or more modeled operations based on correlations between a plurality of different operations in the monitored system.