The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Mar. 30, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Stephen M Lathrop, Milford, MA (US);

Michael J Scharland, Franklin, MA (US);

Kevin Tobin, Hopedale, MA (US);

Assignee:

Dell Products L.P., Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 11/00 (2006.01); G06F 3/06 (2006.01); G06F 3/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1076 (2013.01); G06F 3/067 (2013.01); G06F 3/0619 (2013.01); G06F 3/0644 (2013.01); G06F 3/0659 (2013.01);
Abstract

Sector signature patterns with sector signature values and sector signature parity values are embedded with data slices. A new pattern is embedded with a slice each time the slice data is updated. The patterns are selected in order such that every sector signature value and sector signature parity value changes when a new pattern is embedded. A separate metadata record such as a key is maintained to indicate which pattern has been embedded with the slice. A data integrity check is performed by comparing the embedded sector signature parity values with the metadata record and/or performing a pattern-to-key lookup.


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