The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Jul. 24, 2020
Micro Focus Llc, Santa Clara, CA (US);
Manish Marwah, Santa Clara, CA (US);
Martin Arlitt, Calgary, CA;
Maria Pospelova, Ottawa, CA;
Stephan Jou, Montreal, CA;
MICRO FOCUS LLC, Santa Clara, CA (US);
Abstract
First-order anomaly scores are received from related anomaly detectors. Each first-order anomaly score indicates a likelihood of an anomaly at a target system. A relatedness measure of the related anomaly detectors is determined, based on the first-order anomaly scores that have been received. A higher-order anomaly score is determined based on the relatedness measure that has been determined. The higher-order anomaly score indicates a likelihood of an anomaly at the target system. An anomaly at the target system is detected based on the higher-order anomaly score.