The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Apr. 07, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Uma Srinivasan, Poughkeepsie, NY (US);

K. Paul Muller, Wappingers Fall, NY (US);

Kevin W. Kark, Poughkeepsie, NY (US);

Pamela Antal, Abilene, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/07 (2006.01); G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0727 (2013.01); G06F 11/0751 (2013.01); G11B 20/1816 (2013.01);
Abstract

Pattern recognition is used to proactively treat defects of repeating circuit topologies. A component of a computing environment is monitored for failures. The component includes one or more repeating circuit topologies. A determination is made as to whether a new failure within a repeating circuit topology of the one or more repeating circuit topologies has occurred within a predefined amount of time from a previous failure matching a selected pattern, in which the selected pattern indicates a non-contiguous growing defect. Based on determining the new failure has occurred within the predefined amount of time from the previous failure matching the selected pattern, corrective action for the component is proactively taken.


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