The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Apr. 09, 2018
Applicant:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Inventors:

Anthony T. Gutierrez, Seattle, WA (US);

Sergey Blagodurov, Seattle, WA (US);

Scott A. Moe, Redmond, WA (US);

Xianwei Zhang, Bellevue, WA (US);

Jieming Yin, Bellevue, WA (US);

Matthew D. Sinclair, Redmond, WA (US);

Assignee:

ADVANCED MICRO DEVICES, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/30 (2018.01); G06F 8/71 (2018.01); G06N 3/063 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06F 9/30014 (2013.01); G06F 8/71 (2013.01); G06N 3/063 (2013.01); G06N 3/08 (2013.01);
Abstract

An electronic device includes a controller functional block and a computational functional block. During operation, while the computational functional block executes a test portion of a workload at at least one precision level, the controller functional block monitors a behavior of the computational functional block. Based on the behavior of the computational functional block while executing the test portion of the workload at the at least one precision level, the controller functional block selects a given precision level from among a set of two or more precision levels at which the computational functional block is to execute a remaining portion of the workload. The controller functional block then configures the computational block to execute the remaining portion of the workload at the given precision level.


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