The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Feb. 26, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Xin Jie Lv, Beijing, CN;

Lingyun Wang, Beijing, CN;

Wei Da Xu, Beijing, CN;

Chao Zhang, Beijing, CN;

Ke Xu Zou, Beijing, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/00 (2006.01); G05B 23/02 (2006.01); G06Q 50/06 (2012.01); H02J 3/00 (2006.01); H02J 13/00 (2006.01); G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
G05B 23/0262 (2013.01); G06Q 10/20 (2013.01); G06Q 50/06 (2013.01); H02J 3/00 (2013.01); H02J 13/0006 (2013.01); G05B 2219/32222 (2013.01); H02J 2203/20 (2020.01); Y02E 60/00 (2013.01); Y02P 90/02 (2015.11); Y04S 10/30 (2013.01); Y04S 40/20 (2013.01);
Abstract

A method, system, and computer program product, include recording high-frequency wave data of local arid adjacent fault curves of a power grid to compare the high-frequency wave data with historical fault data to detect an actual fault region in the power grid, the power grid having a plurality of sensors distributed in the power grid, each sensor being upstream of one adjacent sensor and downstream of an other adjacent sensor.


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