The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Jan. 07, 2020
Palantir Technologies Inc., Palo Alto, CA (US);
Mitchell Beard, Falls Church, VA (US);
Kai Shen, Jersey City, NJ (US);
Roger Hu, New York City, NY (US);
Sachi Shah, San Francisco, CA (US);
Miklos Danka, London, GB;
Laurynas Pliuskys, London, GB;
Thomas Pearson, Twickenham, GB;
Palantir Technologies Inc., Palo Alto, CA (US);
Abstract
A system comprising a computer-readable storage medium storing at least one program and a method for determining, tracking, and anticipating risk in a manufacturing facility are presented. In example embodiments, the method includes generating a risk data model for the manufacturing facility based on correlations between historical staffing conditions of the manufacturing facility and deviations from existing manufacturing procedures. The method further includes receiving projected operational data that includes information related to anticipated future staffing conditions of the manufacturing facility. The method further includes calculating a risk score based on the projected operational data using the risk data model. The method further includes causing presentation of a user interface that includes a display of the risk score.