The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Nov. 15, 2020
Applicant:

Ankon Medical Technologies (Shanghai) Co., Ltd, Shanghai, CN;

Inventors:

Xiaodong Duan, Pleasanton, CA (US);

Qingqing Wang, Shanghai, CN;

Qinghu You, Shanghai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G02B 21/36 (2006.01); G02B 21/14 (2006.01); H04N 9/64 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/14 (2013.01); H04N 9/645 (2013.01);
Abstract

The present invention discloses a system and a method for phase contrast microscopy imaging. The system includes a microscope, a light source array, an image acquisition module and a calculation module. The light source array includes a fixture having a through hole and two light source groups arranged around the through hole. The two light source groups emit a first beam and a second beam symmetrically arranged about a optical axis of the microscope to illuminate a specimen. The light beams enter and get scattered in the specimen and are obliquely transmitted through the specimen, and collected by the microscope after passing through the through hole. The image acquisition module acquires a first image corresponding to the first beam and a second image corresponding to the second beam. The calculation module obtains a phase contrast image according to the first and second image.


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