The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Oct. 10, 2019
Olympus Corporation, Tokyo, JP;
Mayumi Odaira, Akiruno, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A sample observation device includes a light source, an illumination optical system, an observation optical system, a detector, a processor, and a drive controller. The illumination optical system includes a condenser lens and an aperture, and the observation optical system includes an objective lens and a light attenuation member. The light attenuation member and the aperture are conjugate. The aperture includes an aperture region, and the light attenuation member includes a light attenuation region. A size of the aperture region, a position of the aperture region, a size of the light attenuation region, and a position of the light attenuation region are set such that a predetermined state is generated. The processor determines light quantity of light received with the detector. The drive controller changes an interval between a sample and the objective lens on the basis of the light quantity such that the light quantity becomes minimum.