The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Dec. 23, 2016
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventor:
Marcus Dyba, Heidelberg, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 26/08 (2006.01); G02B 26/10 (2006.01); G02B 27/64 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0048 (2013.01); G02B 26/0833 (2013.01); G02B 26/101 (2013.01); G02B 27/642 (2013.01);
Abstract
A scanning device for scanning an object in a scanning microscope includes at least one scanning unit configured to two-dimensionally scan the object using a light beam. The scanning unit includes at least one deflection element configured to deflect a light beam impinging thereon. The deflection element is rotationally symmetric in shape. At least one rotation device is configured to rotate the scanning unit about an axis of rotation so as to allow for image field rotation.