The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Aug. 03, 2017
Applicant:

Topcon Corporation, Tokyo-to, JP;

Inventors:

Fumio Ohtomo, Saitama, JP;

Kaoru Kumagai, Tokyo-to, JP;

Tetsuji Anai, Tokyo-to, JP;

Assignee:

TOPCON Corporation, Tokyo-to, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/08 (2006.01); G01B 11/14 (2006.01); G01C 15/00 (2006.01);
U.S. Cl.
CPC ...
G01S 17/08 (2013.01); G01B 11/14 (2013.01); G01C 15/002 (2013.01);
Abstract

A measuring method, wherein point cloud data of a building is acquired by a laser scanner, wherein the laser scanner has an attitude detector for detecting a tilting with respect to a horizontality or a verticality, converts the point cloud data into a horizontal distance and a height or a difference of a height based on the tilting detected by the attitude detector, sets a height line at a predetermined height on a wall surface, averages a horizontal distance information of the point cloud data included in a predetermined width with the height line as a center in a height direction, further develops the horizontal distance information along the height line in a horizontal direction, and measures a horizontal cross section at the predetermined height.


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