The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Jun. 12, 2020
Hitachi, Ltd., Tokyo, JP;
Akihiro Odaka, Tokyo, JP;
Kousuke Itou, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
An object of the present invention is to provide an MRI apparatus capable of optimally setting imaging conditions for map measurement depending on a target value and its required accuracy, and a method for controlling the MRI apparatus. An imaging unit of the MRI apparatus includes, as a pulse sequence, a pulse sequence for the T1 map measurement that includes a first signal acquisition sequence and a plurality of signal acquisition sequences executed after application of an inverted pulse and at different signal acquisition times from the inverted pulse. An imaging controller of the MRI apparatus controls the imaging conditions of each of the plurality of signal acquisition sequences, for example, the signal acquisition time from the inverted pulse and the number of signal acquisition sequences depending on the T1 value of an imaging target and the required accuracy.