The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Apr. 04, 2018
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Abderrahim Chahid, Hemhofen, DE;

Ingolf Hoffmann, Herzogenaurach, DE;

Alexander Itzke, Nuremberg, DE;

Roland Weiss, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 15/08 (2006.01); G01R 15/20 (2006.01); G01R 15/18 (2006.01);
U.S. Cl.
CPC ...
G01R 15/08 (2013.01); G01R 15/185 (2013.01); G01R 15/202 (2013.01);
Abstract

In a method for measuring a current, a plurality of flux-gate field sensors is arranged with radial symmetry on a first circumferential path, and a plurality of Hall sensors is arranged with radial symmetry on a second circumferential path such that a one of the flux-gate field sensors is placed adjacent a one of the Hall sensors, with the flux-gate field sensors having a sensitivity which is higher by a factor 5 to 20 than a sensitivity of the Hall sensors. At least one of the plurality of flux-gate field sensors is evaluated so as to determine a current intensity, when two of the flux-gate field sensors generate measurement values within a measurement range, or at least one of the plurality of Hall sensors is evaluated so as to determine a current intensity, when the measurement values of the two flux-gate field sensors are outside of the measurement range.


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