The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Dec. 12, 2019
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 15/00 (2006.01); G06F 16/2455 (2019.01);
U.S. Cl.
CPC ...
G01P 15/00 (2013.01); G06F 16/24568 (2019.01);
Abstract
Provided is a measurement device including a data acquisition unit that acquires a data stream obtained in time series by a first sensor provided in a structure, and representing impact given to the structure by a movement of a moving object, and a processing unit that obtains a covariance based on the data stream and detects a timing of the impact given to the structure by the movement of the moving object, based on the covariance.
Miki, Chitoshi. (2021). Measurement device and measurement system (U.S. Patent No. 11150263). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11150263
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile