The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Jul. 30, 2018
Applicants:

National Institutes for Quantum and Radiological Science and Technology, Chiba, JP;

Sysmex Corporation, Kobe, JP;

Inventors:

Takahiko Tokuda, Kyoto, JP;

Harutsugu Tatebe, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/68 (2006.01); G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
G01N 33/6896 (2013.01); G01N 33/54306 (2013.01); G01N 33/54313 (2013.01); G01N 2440/14 (2013.01); G01N 2800/2821 (2013.01);
Abstract

Disclosed is a method for measuring phosphorylated tau protein in a biological sample collected from a subject, comprising the steps of: preparing a measurement sample containing a non-capture bead and a capture bead to which an immune complex is bound, by forming the immune complex of the phosphorylated tau protein in the biological sample, a capture antibody and a detection antibody on the capture bead, in the presence of the non-capture bead; and detecting a signal derived from the immune complex in the measurement sample.


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