The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

Jun. 29, 2018
Applicant:

3m Innovative Properties Company, St. Paul, MN (US);

Inventors:

Christopher R. Yungers, Saint Paul, MN (US);

David H. Redinger, Afton, MN (US);

Eric M. Chinnock, Chanhassen, MN (US);

Jennifer F. Schumacher, Woodbury, MN (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/20 (2006.01);
U.S. Cl.
CPC ...
G01N 27/20 (2013.01);
Abstract

A measurement system may include an electrical signal source; a plurality of electrical contacts electrically coupled to a tested material; a respective resistor associated with each electrical contact; a common node to which the respective resistors are electrically connected; and a control module. The control module may cause the electrical signal source to be electrically connected to a selected electrical contact as an input electrical contact. The remaining electrical contacts are electrically connected to a return node of the electrical signal source as extraction electrical contacts. The control module also may cause the electrical signal source to output an electrical signal to an input electrical contact; cause a respective electrical signal parameter to be determined at the respective resistor associated with each respective extraction electrical contact; and determine whether the tested material includes a crack or other defect based on the respective electrical signal parameters.


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