The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Jul. 18, 2019
International Business Machines Corporation, Armonk, NY (US);
Michael Engel, Rio de Janeiro, BR;
Jeannette M. Garcia, San Leandro, CA (US);
Ricardo L. Ohta, Sao Paulo, BR;
Ademir F. Silva, Sao Paulo, BR;
Mathias B. Steiner, Rio de Janeiro, BR;
Jaione Tirapu Azpiroz, Rio de Janeiro, BR;
Thomas G. Zimmerman, Cupertino, CA (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A system is provided for performing metal trace analysis on a liquid sample. A sample holder holds an analysis substrate that includes a reference region and at least one test region. An ultraviolet (UV) light source emits ultraviolet light illuminating the liquid sample. An optical sensor detects radiation emanating from the liquid sample and converting the detected radiation into an electrical signal. A microcontroller processes the electrical signal. An external interface transmits the processed electrical signal to an external device. The analysis substrate is configured for manual movement by a user. A tracking system detects a sample scanning location for the metal trace analysis, and includes a light source, other than the UV light source, and another optical sensor. The other optical sensor detects light emitted by the light source.