The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Nov. 13, 2019
Applicant:
Sentek Instrument, Llc, Blacksburg, VA (US);
Assignee:
SENTEK INSTRUMENT LLC, Blacksburg, VA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 11/32 (2021.01); G01K 11/3206 (2021.01); G01L 9/00 (2006.01); G01L 19/00 (2006.01); G01D 5/26 (2006.01);
U.S. Cl.
CPC ...
G01K 11/3206 (2013.01); G01D 5/266 (2013.01); G01D 5/268 (2013.01); G01L 9/0079 (2013.01); G01L 19/0092 (2013.01);
Abstract
A system for measuring pressure, temperature or both includes a diaphragm that responds to a change in temperature or pressure, and a base connected to the diaphragm that has a sapphire element. Between the diaphragm and the base is a cavity. An optical fiber that conducts light reflected off of a surface of the diaphragm is adjacent the cavity. An interrogator is used for detecting a deflection of the diaphragm based on at least two reflected light signals having similar wavelengths and coherence lengths. A quadrature phase detection unit demodulates signals received by the interrogator.