The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Jul. 07, 2020
Raytheon Company, Waltham, MA (US);
Scott Sorbel, Tucson, AZ (US);
Raytheon Company, Waltham, MA (US);
Abstract
A bidirectional reflectance distribution function (BRDF) measurement system is provided that measures the BRDF across many photonic bands such as the UV, Vis, NIR, SWIR, MWIR, and LWIR (scale) simultaneously (speed) in an innovative measurement system. The measurement system includes an illuminating optical system, a detection system, and a calibration reference. The illuminating optical system directs illuminating light to an imaging location and the detection system detects returning light from the imaging location. The calibration reference including an optical metamaterial having a receiving surface. The calibration reference is placed at the imaging location and alters illuminating light incident on the receiving surface to produce returning light having known optical properties.