The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 19, 2021

Filed:

May. 20, 2014
Applicant:

Fiber Optic Sensor Systems Technology Corporation, Washington, DC (US);

Inventors:

Nicholas Lagakos, Silver Spring, MD (US);

Victor Kaybulkin, Chantilly, VA (US);

Patrick Hernandez, Silver Spring, MD (US);

Christopher Vizas, Washington, DC (US);

Assignee:

SMARTSENSECOM, INC., Washington, DC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/26 (2006.01); G02B 6/04 (2006.01); G02B 6/42 (2006.01);
U.S. Cl.
CPC ...
G01D 5/268 (2013.01); G02B 6/04 (2013.01); G02B 6/4298 (2013.01);
Abstract

A multiplexed fiber optic sensor system including at least one light source, one or more first optical fibers having a first end arranged to receive light from the light source(s) and transmit the light to at least one fiber optic sensor, and one or more second optical fibers arranged to receive reflected light from the fiber optic sensors and transmit the reflected light to a light sensing element. Using the sensor system, it is possible to measure physical phenomena, such as electromagnetic phenomena, along multiple points along or within a material or structure of interest or on separate materials or structures. The fiber optic sensors can be electromagnetic phenomena sensors, pressure sensors, acceleration sensors, strain sensors, temperature sensors, or other sensors designed to measure physical phenomena. The sensor system can be used to measure phenomena of interest at several locations or take different kinds of measurements at the same or approximately the same location.


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