The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 19, 2021
Filed:
Jul. 30, 2019
Carl Zeiss Meditec Ag, Jena, DE;
Markus Seesselberg, Aalen, DE;
Christoph Hauger, Aalen, DE;
Artur Hoegele, Oberkochen, DE;
Joachim Steffen, Westhausen, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
An ophthalmic surgical microscope includes a main objective lens, through which an observation beam path passes, and a confocal optical system configured as a refractometer to determine the refraction of an eye. The optical system includes a measurement light source to generate a measurement light beam, a light detector to measure an intensity of measurement light and an optical unit to direct the measurement light beam onto the retina of the eye and to return measurement light reflected back at the retina to the light detector. The optical system includes an adaptive optical module (AOM) to modify a wavefront of the measurement beam path such that an intensity of the back-reflected measurement light changes. A spherical equivalent (SE) of the ametropia of the eye is determined based on a setting of the AOM, at which the measured intensity of the back-reflected measurement light has a maximum.