The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Oct. 09, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

James A. Busby, New Paltz, NY (US);

John R. Dangler, Rochester, MN (US);

Michael J. Fisher, Poughkeepsie, NY (US);

David C. Long, Wappingers Falls, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 1/02 (2006.01); H05K 1/11 (2006.01); H05K 1/18 (2006.01); H05K 5/02 (2006.01); G01N 27/04 (2006.01); G06F 21/87 (2013.01); G06F 21/86 (2013.01); H01L 23/00 (2006.01); H05K 1/09 (2006.01);
U.S. Cl.
CPC ...
H05K 1/0275 (2013.01); G01N 27/045 (2013.01); G06F 21/86 (2013.01); G06F 21/87 (2013.01); H01L 23/576 (2013.01); H05K 1/115 (2013.01); H05K 1/181 (2013.01); H05K 5/0208 (2013.01); H05K 1/0298 (2013.01); H05K 1/09 (2013.01); H05K 2201/10151 (2013.01); H05K 2201/10204 (2013.01); H05K 2201/10371 (2013.01); H05K 2201/10522 (2013.01);
Abstract

Tamper-respondent assemblies and methods of fabrication are provided which include at least one tamper-respondent sensor and a detector. The at least one tamper-respondent sensor includes conductive lines which form, at least in part, at least one tamper-detect network of the tamper-respondent sensor(s). In addition, the tamper-respondent sensor(s) includes at least one interconnect element associated with one or more conductive lines of the conductive lines forming, at least in part, the tamper-detect network(s). The interconnect element(s) includes at least one interconnect characteristic selected to facilitate obscuring a circuit lay of the at least one tamper-detect network. The at least one interconnect element is undetectable by x-ray, and the conductive lines are detectable by x-ray. In operation, the detector monitors the tamper-detect network(s) of the tamper-respondent sensor(s) for a tamper event.


Find Patent Forward Citations

Loading…