The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Feb. 16, 2018
Mitsubishi Electric Corporation, Tokyo, JP;
Shusaku Takamoto, Tokyo, JP;
Takeo Fujita, Tokyo, JP;
MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;
Abstract
An abnormality detection device includes processing circuitry configured to calculate an index value indicating a sum of edge strengths in a second image that is an image captured by a camera for capturing a vehicle compartment at timing before a user enters a vehicle, calculate a differential value between an index value indicating a sum of edge strengths in a reference image, which is an image captured by the camera under an imaging condition equivalent to an imaging condition of the second image before the second image is captured, and the calculated index value, determine whether the differential value is equal to or greater than a threshold value, and execute control to output a warning in a case where it is determined that the differential value is equal to or greater than the threshold value.