The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Mar. 26, 2020
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Michihiro Yamagata, Osaka, JP;

Norihiro Imamura, Osaka, JP;

Keiichi Matsuzaki, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 5/225 (2006.01); B60R 11/04 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2254 (2013.01); B60R 11/04 (2013.01); H04N 5/2256 (2013.01); H04N 5/2253 (2013.01);
Abstract

A camera system includes an image sensor, a wavelength filter, and an imaging optical system. The image sensor has an image capturing plane. The imaging optical system is configured to have light coming from a subject passed through the wavelength filter and imaged on the image capturing plane. The wavelength filter has a perpendicularly incident region and an obliquely incident region. On the perpendicularly incident region, a principal ray, which has passed through the imaging optical system, is incident perpendicularly. On the obliquely incident region, a principal ray, which has passed through the imaging optical system, is incident obliquely. The image sensor has sensitivity to a light ray having a predetermined wavelength. The light ray having the predetermined wavelength is transmitted at a higher transmittance through at least a part of the obliquely incident region than through the perpendicularly incident region.


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