The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Aug. 27, 2020
Applicants:

Alexander Soto, San Diego, CA (US);

Walter Soto, San Clemente, CA (US);

Inventors:

Alexander Soto, San Diego, CA (US);

Walter Soto, San Clemente, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2013.01); H04B 10/071 (2013.01); H04J 14/02 (2006.01); G01M 11/00 (2006.01); H04B 10/077 (2013.01); H04J 14/00 (2006.01);
U.S. Cl.
CPC ...
H04B 10/071 (2013.01); G01M 11/3145 (2013.01); G01M 11/3172 (2013.01); H04B 10/0775 (2013.01); H04J 14/02 (2013.01); H04J 14/0247 (2013.01); H04J 14/0252 (2013.01); H04J 14/0256 (2013.01); H04J 14/0257 (2013.01); H04J 14/0267 (2013.01); H04J 14/0275 (2013.01); H04J 14/0279 (2013.01); H04J 14/0282 (2013.01); H04J 14/0226 (2013.01); H04J 14/0273 (2013.01);
Abstract

A system and method for performing an in-service optical time domain reflectometry test, an in-service insertion loss test, and an in-service optical frequency domain reflectometry test using a same wavelength as the network communications for point-to-point or point-to-multipoint optical fiber networks while maintaining continuity of network communications are disclosed.


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