The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Feb. 01, 2019
Applicant:
Mitsubishi Electric Corporation, Tokyo, JP;
Inventor:
Shinji Sakai, Tokyo, JP;
Assignee:
Mitsubishi Electric Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 17/08 (2006.01); H03K 17/0812 (2006.01); H01L 23/00 (2006.01); H02H 1/00 (2006.01);
U.S. Cl.
CPC ...
H03K 17/08122 (2013.01); H01L 24/49 (2013.01); H02H 1/0007 (2013.01); H03K 17/08128 (2013.01); H01L 2924/13055 (2013.01); H01L 2924/13064 (2013.01); H01L 2924/13091 (2013.01); H01L 2924/1426 (2013.01);
Abstract
To provide a technique to complement overcurrent protection and short circuit protection. An LVIC includes an overcurrent detector configured to detect whether or not a first current flowing through a load and a semiconductor switching element is abnormal and a short-circuit detector configured to detect whether or not a second current flowing not through the load but through the semiconductor switching element is abnormal. The LVIC interrupts the semiconductor switching element based on a detection result of the overcurrent detector and a detection result of the short-circuit detector.