The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Nov. 25, 2020
Applicant:

Cimpress Schweiz Gmbh, Winterthur, CH;

Inventor:

Anshul Garg, Bangalore, IN;

Assignee:

CIMPRESS SCHWEIZ GMBH, Winterthur, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/20 (2006.01); G06K 9/46 (2006.01); G06T 7/13 (2017.01); G06T 7/90 (2017.01); G06T 7/00 (2017.01); G06T 11/60 (2006.01);
U.S. Cl.
CPC ...
G06T 7/13 (2017.01); G06T 7/0006 (2013.01); G06T 7/90 (2017.01); G06T 11/60 (2013.01); G06T 2207/30144 (2013.01);
Abstract

Systems and methods for detecting crop marks depicted in digital images are disclosed. According to certain aspects, an electronic device may, in conjunction with enabling a user to customize a product design, facilitate a set of digital image processing functionalities to detect a set of crop marks depicted in a digital image associated with the product design. In particular, the systems and methods may detect a first set of lines depicted in a processed digital image indicative of content of interest extracted from the digital image, and detect a second set of lines depicted in a subtracted digital resulting from subtracting a set of contours from the processed digital image. The systems and methods may determine the set of crop marks from the first and second sets of lines.


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