The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Oct. 24, 2019
Institute for Information Industry, Taipei, TW;
Kai-Hsuan Chan, Taipei, TW;
INSTITUTE FOR INFORMATION INDUSTRY, Taipei, TW;
Abstract
A multi-view mammogram image analysis method, multi-view mammogram image analysis system and non-transitory computer-readable medium are provided in this disclosure. The multi-view mammogram image analysis method includes the following operations: inputting a plurality of mammogram images; utilizing a symptom identification model to determine whether the mammogram images have an abnormal state, and generating a plurality of heat maps corresponding to the mammogram images; utilizing a false positive filtering model to determine whether the heat maps have a false positive feature, and generating an abnormal probability corresponding to the heat maps; and utilizing a first threshold to determine the abnormal probability, if the abnormal probability is greater than the first threshold, detecting and outputting a lesion position corresponding to the heat maps.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile