The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

May. 20, 2019
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Yusuke Nakanishi, Kawasaki, JP;

Hideyuki Kikuchi, Chigasaki, JP;

Koichi Oikawa, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/35 (2017.01); G06T 7/40 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06T 7/35 (2017.01); G06T 7/40 (2013.01); G06T 7/97 (2017.01);
Abstract

An image processing method is performed by a computer, for determining that a line is a crack or something other than the crack. The method includes: extracting a linear region from an image of an object captured by an imaging apparatus; determining a luminosity change in a direction traversing the linear region at each of a plurality of positions separate in a longitudinal direction of the linear region; and identifying a type of the linear region based on the luminosity changes at the plurality of positions.


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