The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Nov. 19, 2019
Idemia Identity & Security France, Courbevoie, FR;
Aldo Maalouf, Courbevoie, FR;
IDEMIA IDENTITY & SECURITY FRANCE, Courbevoie, FR;
Abstract
A method of deblurring an observed image acquired by an image sensor in order to determine an observable image corresponding to the deblurred observed image. The observable image and the observed image each are formed by a set of pixels defined by at least one numerical value. The method involves expressing the observable image as a solution minimizing a Tikhonov functional defined by the observed image, applying a spreading function at the point of the image sensor and applying a wavelet transform operator. The Tikhonov functional is expressed as a sum of at least two terms. The method further involves determining the observable image by implementing an iterative projection algorithm released on a closed convex, at each iteration of which, the successive application of a projection operator associated with each of the terms of the Tikhonov functional.