The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Sep. 13, 2019
University of Manitoba, Winnipeg, CA;
Young Jin Cha, Winnipeg, CA;
Wooram Choi, Winnipeg, CA;
Other;
Abstract
Structure defect detection is performed using computer-implemented arrangements employing machine learning algorithms in the form of neural networks. In one arrangement, a convolutional neural network is trained using a database of images formed to optimize accuracy of the convolutional neural network to detect, for example, a crack in a concrete surface. A two-stage scanning process each performing a plurality of scans of a test image is incorporated in the foregoing arrangement of convolutional neural network, with the two-stages forming overlapping capture areas to reduce likelihood of a crack lying on a boundary of the individual scans going undetected. Also, region-based convolutional neural networks are trained to detect various types of defects.