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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11144789 B1

PDFFull Text
Date of Patent:
Oct. 12, 2021

Filed:

Sep. 18, 2019

Model parameter learning device, control device, and model parameter learning method

Applicants:

Honda Motor Co., Ltd., Tokyo, JP;

Kyoto University, Kyoto, JP;

Inventors:

Kosuke Nakanishi, Saitama, JP;

Yuji Yasui, Saitama, JP;

Wataru Sasaki, Kyoto, JP;

Shin Ishii, Kyoto, JP;

Assignees:

HONDA MOTOR CO., LTD., Tokyo, JP;

KYOTO UNIVERSITY, Kyoto, JP;

Attorney:

Westerman, Hattori, Daniels & Adrian, LLP

Primary Examiner:

Charlotte M Baker

Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06N 3/08 (2006.01); G06N 3/04 (2006.01); G06K 9/40 (2006.01); G05D 1/02 (2020.01);
U.S. Cl.
CPC ...
G06K 9/6262 (2013.01); G05D 1/0221 (2013.01); G06K 9/40 (2013.01); G06K 9/6256 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G05D 2201/0213 (2013.01);
Abstract

Provided is a model parameter learning device and the like capable of learning model parameters such that the influence of a noise in input data can be suppressed. A model parameter learning device () alternately carries out first learning processing for learning model parameters W, b, Wand bsuch that an error between data Xand data Xis minimized, and second learning processing for learning model parameters W, b, W, b, Wand bsuch that a loss function Lis minimized.

Find Patent Forward Citations

Nakanishi, Kosuke. (2021). Model parameter learning device, control device, and model parameter learning method (U.S. Patent No. 11144789). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11144789

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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