The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Oct. 19, 2020
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Jack Lawson Bishop, III, Evanston, IL (US);

Timothy Andrew Wright, England, GB;

Robert Riley Zink, Chicago, IL (US);

Assignee:

BANK OF AMERICA CORPORATION, Charlotte, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 21/57 (2013.01); G06F 16/958 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3688 (2013.01); G06F 16/958 (2019.01); G06F 21/577 (2013.01); G06F 2221/033 (2013.01);
Abstract

Systems, computer program products, and methods are described herein for testing an application with dynamically linked security tests. The present invention may be configured to perform, using a request engine, based on the first data, and based on test protocols stored in a first data structure, a first security test on an application. The present invention may be further configured to determine, based on determining that the application failed the first security test and based on a second data structure, whether the first security test is linked to one or more other security tests, where the second data structure includes security test sequences linking security tests and/or data to transmit from the first security test to the one or more other security tests, and provide, to the first queue, one or more other security tests to which the first security test is linked.


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