The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Oct. 26, 2018
Samsung Electronics Co., Ltd, Suwon-si, KR;
Michael Sapienza, Mountain View, CA (US);
Ankur Gupta, Santa Clara, CA (US);
Abhijit Bendale, Sunnyvale, CA (US);
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method for semi-dense depth estimation includes receiving, at an electronic device, a control signal of a speckle pattern projector (SPP and receiving from each sensor of a dynamic vision sensor (DVS) stereo pair, an event stream of pixel intensity change data, wherein the event stream is time-synchronized with the control signal of the SPP. The method further includes performing projected light filtering on the event stream of pixel intensity change data for each sensor of the DVS stereo pair, to generate synthesized event image data, the synthesized event image data having one or more channels, each channel based on an isolated portion of the event stream of pixel intensity change data and performing stereo matching on at least one channel of the synthesized event image data for each sensor of the DVS stereo pair to generate a depth map for at least a portion of the field of view.