The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
May. 02, 2019
Carl Zeiss Meditec Ag, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A microscopy method for imaging an object includes: imaging the object into an optical image onto an image detector, generating electronic image data from the optical image using the image detector and generating an electronic image from the electronic image data, defining a region of interest in the electronic image, determining a depth distribution in the region of interest and/or in a region of the object corresponding to the region of interest, determining a desired depth region in the depth distribution, selecting at least one imaging parameter with which a size of a depth-of-field region can be changed, and setting the depth-of-field region of the electronic image by changing the at least one selected imaging parameter such that the depth-of-field region covers the desired depth region or covers a specific portion thereof.