The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Oct. 26, 2018
Applicant:
Texas Tech University System, Lubbock, TX (US);
Inventors:
Shelby Lacouture, Lubbock, TX (US);
Stephen Bayne, Lubbock, TX (US);
Assignee:
TEXAS TECH UNIVERSITY SYSTEM, Lubbock, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/26 (2020.01); H01L 21/66 (2006.01); G01R 3/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2642 (2013.01); G01R 3/00 (2013.01); G01R 31/2648 (2013.01); G01R 31/2891 (2013.01); H01L 22/20 (2013.01); H01L 2224/023 (2013.01); H01L 2224/05599 (2013.01); H01L 2924/00 (2013.01); H01L 2924/0002 (2013.01); H01L 2924/00014 (2013.01);
Abstract
A system, method and apparatus for measuring carrier lifetime of a device comprises subjecting a test device to a voltage via a voltage source associated with the test system, disconnecting the test device from the voltage source, measuring the voltage as a function of time, measuring the current as a function of time, and determining a carrier lifetime of the test piece according to the slope of the measured voltage and the measured current.