The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Jun. 05, 2018
Optimal Plus Ltd., Holon, IL;
Shaul Teplinsky, San Francisco, CA (US);
Michael Schuldenfrei, Petach Tikwa, IL;
Dan Sebban, Rishon LeZion, IL;
OPTIMAL PLUS LTD., Holon, IL;
Abstract
A method includes receiving system test data for a plurality of electronic systems. Each of the electronic systems includes a plurality of electronic components. The method also includes determining a relationship between a set of electronic components and the electronic systems upon which the electronic components of the set of electronic components are assembled and receiving manufacturing attributes including spatial data for the set of electronic components. The method further includes selecting a data subset from the system test data corresponding to a subgroup of the set of electronic components. The subgroup includes components within an area defined on a substrate according to a spatial pattern and that is fewer than all of the set of electronic components on the substrate. Additionally, the method includes identifying an outlier relative to the data subset and communicating information about the outlier to at least one of a system or a component manufacturer.