The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Jun. 29, 2020
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Johannes Steffens, Rosenheim, DE;
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Abstract
A measuring method for locating an imperfection in an electrically conductive material comprises applying an electric input signal with an electric signal generator to the electrically conductive material such that the electrically conductive material acts as an antenna and thereby transmits an electromagnetic output signal having a frequency spectrum comprising a contributing frequency corresponding to the imperfection within the electrically conductive material; receiving the electromagnetic output signal with an antenna detection system, wherein the antenna detection system probes the frequency spectrum of the electromagnetic output signal as a function of at least one of position and direction; and locating the imperfection within the electrically conductive material by analyzing with an analysis device a spatial origin of the contributing frequency within the frequency spectrum of the received electromagnetic output signal.