The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Apr. 01, 2019
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Andrew Schaefer, Oberhaching, DE;

Markus Freidhof, Kirchseeon, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 19/25 (2006.01); G01R 19/257 (2006.01);
U.S. Cl.
CPC ...
G01R 19/2509 (2013.01); G01R 19/257 (2013.01);
Abstract

A method for and apparatus processing a measurement signal of a dynamic physical quantity is provided which includes acquiring a measurement signal representing the dynamic physical quantity over time; comparing the acquired measurement signal with a predefined signal characteristic of the respective physical quantity or with a signal characteristic of another physical quantity being dependent from the respective physical quantity to provide a comparison result; and adjusting a waveform representing the acquired measurement signal based upon the comparison result. A digital oscilloscope is also provided.


Find Patent Forward Citations

Schaefer, Andrew. (2021). Method and apparatus for processing a measurement signal (U.S. Patent No. 11143679). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11143679

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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