The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Sep. 14, 2017
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Akihiro Yasui, Tokyo, JP;

Gorou Yoshida, Tokyo, JP;

Yoshiki Muramatsu, Tokyo, JP;

Isao Yamazaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/02 (2006.01); G01N 35/00 (2006.01); G01N 35/10 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/025 (2013.01); G01N 35/00722 (2013.01); G01N 35/1081 (2013.01); G01N 2035/009 (2013.01); G01N 2035/00702 (2013.01); G01N 2035/0432 (2013.01); G01N 2035/0443 (2013.01); G01N 2035/0444 (2013.01);
Abstract

An automatic analyzer () includes: a storage unit () that stores various parameters of the automatic analyzer () in association with each of elevations used in the automatic analyzers (), the parameters being optimized for each of the elevations; an input unit () that acquires information of an elevation at which the automatic analyzer () is provided; and a controller () that reads the parameters stored in the storage unit () and sets the read parameters to the automatic analyzer () based on the elevation acquired by the input unit (). As a result, various parameters can be easily adjusted according to a usage environment of the device.


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