The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Nov. 28, 2017
Applicant:

Technische Universität München, Munich, DE;

Inventors:

Florian Schaff, Murrumbeena, AU;

Franz Pfeiffer, Unterföhring, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01); G01N 23/20025 (2018.01); G01N 23/201 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 23/201 (2013.01); G01N 23/20025 (2013.01); G01N 2223/045 (2013.01); G01N 2223/419 (2013.01);
Abstract

The invention relates to an X-ray CT method and in particular a registration-based dark-field tensor tomography method for testing a sample () by means of X-rays, with which method a sample () is consecutively scanned by means of X-rays in at least two fixed orientations differing from one another while rotating about a fixed rotation axis, in every orientation of the sample () on the basis of dark-field signals a plurality of scatter data sets is recorded, and the scatter data sets for different orientations are matched to one another by registration and combined into a common scatter data set reflecting a possible angular dependence of the scatter present due to the sample ().


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