The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
May. 28, 2020
Shimadzu Corporation, Kyoto, JP;
Tadaoki Takii, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
Provided is a material testing machine capable of giving an appropriate testing force to a testing piece. The material testing machine performs a three-point bending test on a testing piece and includes a support mechanism that supports the testing piece, an indenter that is connected to an ultrasonic oscillator and gives ultrasonic vibration to the testing piece by abutting against the testing piece, and a load mechanism that presses the indenter to the testing piece supported by the support mechanism. The support mechanism includes: a spherical seat that has a lower member equipped with a spherical-surface-shaped concave portion or convex portion, and an upper member equipped with a spherical-surface-shaped concave portion or convex portion having a shape corresponding to the concave portion or convex portion in the lower member; a holding portion; and a first movable member.