The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Jun. 08, 2020
Chongqing Institute of East China Normal University, Chongqing, CN;
East China Normal University, Shanghai, CN;
Heping Zeng, Chongqing, CN;
Ming Yan, Chongqing, CN;
Yinqi Wang, Chongqing, CN;
Xiaoyue Wang, Chongqing, CN;
CHONGQING INSTITUTE OF EAST CHINA NORMAL UNIVERSITY, Chongqing, CN;
EAST CHINA NORMAL UNIVERSITY, Shanghai, CN;
Abstract
Provided are a method and a system for measuring a transient time width of an ultrashort pulse in real time. The method includes: performing an interaction of a laser pulse to be measured with a linear chirped pulse in a second-order non-linear medium, to generate a sum-frequency beam, wherein an intensity sag occurs in the chirped pulse after the interaction; performing a time spreading by a time stretching system on the chirped pulse with the intensity sag; detecting the spread chirped pulse with the spread intensity sag by a photoelectric detector, and measuring and recording a time width τ' of the spread intensity sag by an oscilloscope; and obtaining the transient time width τ of the laser pulse to be measured according to a formula of τ=τ′/M, where M is an amplification coefficient of the time stretching system.