The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Jan. 25, 2018
University of Maryland, College Park, College Park, MD (US);
Giuliano Scarcelli, Washington, DC (US);
Eitan Edrei, Silver Spring, MD (US);
UNIVERSITY OF MARYLAND, COLLEGE PARK, College Park, MD (US);
Abstract
In a spectrometry setup where a first spectral component dominates a second spectral component having a different wavelength, diffraction of the first spectral component as it passes through the optical train of the spectrometer can produce spectral noise that obscures detection of the second spectral component. To reduce the spectral noise, the light from the spectrometer is subject to spatial filtering or interference such that effects of the first spectral component are removed, or at least reduced. The second spectral component can then be more readily detected by a detector after the spatial filtering or interference. In embodiments, the spatial filtering or interference may be provided by a filtering module, which may be installed in existing spectrometry setups or form part of a unitary spectrometry system.