The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 12, 2021
Filed:
Mar. 24, 2017
Applicant:
Hitachi High-tech Science Corporation, Tokyo, JP;
Inventors:
Kentaro Yamada, Tokyo, JP;
Yasuyuki Takagi, Tokyo, JP;
Assignee:
Hitachi High-Tech Science Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/00 (2006.01); G01G 9/00 (2006.01); G01N 25/20 (2006.01); B01L 3/04 (2006.01); G01N 5/04 (2006.01);
U.S. Cl.
CPC ...
G01G 9/00 (2013.01); G01N 25/20 (2013.01); B01L 3/04 (2013.01); G01N 5/04 (2013.01);
Abstract
A sample container of a thermal analyzer that performs thermogravimetry or calorimetry includes a bottomed cylindrical body portion and a cover portion abutting against an opening of the body portion and covering at least a part of the opening. The cover portion includes a first cover portion abutting against an edge portion of the opening and having a second opening in a part of the first cover portion, and a second cover portion separated from the first cover portion in an axial direction of the body portion so as to cover at least a part of the second opening.