The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Nov. 20, 2018
Applicant:

Topcon Corporation, Tokyo-to, JP;

Inventors:

Kaoru Kumagai, Tokyo-to, JP;

Ken-ichiro Yoshino, Tokyo-to, JP;

Assignee:

TOPCON Corporation, Tokyo-to, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2013.01); G01C 3/08 (2006.01); G01S 7/481 (2006.01); G01S 17/42 (2006.01); G06T 7/30 (2017.01); G01C 15/00 (2006.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G01C 3/08 (2013.01); G01C 15/002 (2013.01); G01S 7/481 (2013.01); G01S 7/4817 (2013.01); G01S 17/42 (2013.01); G01S 17/89 (2013.01); G06T 7/30 (2017.01); G06T 2207/10028 (2013.01);
Abstract

A surveying instrument comprises a first measuring component having a control module and a second measuring component, wherein the control module acquires point cloud data of a whole circumference in a room with the use of the second measuring component in accordance with each installation point, makes the first measuring component to measure a predetermined position in the room, prepares outer shape data of a same height and a same shape in accordance with each installation point based on a measurement result of the first measuring component or the second measuring component, performs a shape matching of each outer shape data, and registers each point cloud data based on a movement amount and a rotation amount at the time of performing the shape matching.


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