The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Mar. 26, 2020
Applicant:

Polymer Technology Systems, Inc., Whitestown, IN (US);

Inventors:

Steven Zucker, Indianapolis, IN (US);

Donnie Smith, Indianapolis, IN (US);

Christopher Dailey, Whitestown, IN (US);

Jonathan Broadwell, Whitestown, IN (US);

Assignee:

POLYMER TECHNOLOGY SYSTEMS, INC., Whitestown, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); B01L 9/00 (2006.01); G01V 8/12 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); B01L 9/52 (2013.01); G01V 8/12 (2013.01); B01L 2300/06 (2013.01);
Abstract

In one embodiment, a system for determining the proper positioning of a test strip includes a test strip having a first reading window and a strip holder. The system further includes a meter, the meter receiving and configured to receive the test strip, the meter having a first light source of a first color and a second light source of a second color and a first read window. The meter is configured to illuminate the first light source; detect a first reflectance with the meter through the first read window; and determine if the first reflectance is greater than a no-strip value.


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