The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 12, 2021

Filed:

Sep. 12, 2019
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Michael Kon Yew Hughes, Vancouver, CA;

Sebastien Tixier, North Vancouver, CA;

Tobias Nebel, North Vancouver, CA;

Assignee:

Honeywell International Inc., Charlotte, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/06 (2006.01); G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
G01B 7/105 (2013.01); G01B 7/06 (2013.01); G01B 11/0616 (2013.01);
Abstract

A sensor system includes an eddy current sensor including at least one coil with excitation electronics coupled across the coil. An optical displacement sensor is secured to the eddy current sensor so that a vertical distance between the sensors is fixed. The optical displacement sensor is located on top of and concentric with the coil so that a measurement axis of the optical displacement sensor is collinear with an axis of symmetry of the coil. A computing device including a processor and memory is coupled to receive sensor data from the eddy current sensor and the optical displacement sensor that is adapted for analyzing the sensor data obtained from measuring a coated substrate including a coating layer on at least one side of a metal substrate to determine at least a thickness of the coating layer.


Find Patent Forward Citations

Loading…